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SN74BCT8374ADW

Part No :

SN74BCT8374ADW

Manufacturer
Texas Instruments
Description
IC SCAN TEST DEVICE W/FF 24-SOIC
Catalog
Logic - Specialty Logic
DataSheet
SN74BCT8374ADW PDF
Unit Price
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Stock Num
75
Min Qty
1
Series
74BCT
Package
Tube

SN74BCT8374ADW Specifications

Type Description
rohs: RoHS
logic type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
part status: Active
mounting type: Surface Mount
number of bits: 8
package / case: 24-SOIC (0.295", 7.50mm Width)
supply voltage: 4.5V ~ 5.5V
operating temperature: 0°C ~ 70°C
supplier device package: 24-SOIC